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2002 | 102 | 2 | 233-238
Article title

Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction

Content
Title variants
Languages of publication
EN
Abstracts
EN
The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.
Keywords
EN
Year
Volume
102
Issue
2
Pages
233-238
Physical description
Dates
published
2002-08
received
2001-09-23
References
  • 1. A. Cedola, S. Lagomarsino, S. Di Fonzo, W. Jark, C. Riekel, P. Deschamps, J. Synchrotron Radiat., 5, 17, 1998
  • 2. W. Jark, S. Di Fonzo, S. Lagomarsino, A. Cedola, E. Di Fabrizio, A. Bram, C. Riekel, J. Appl. Phys., 80, 4831, 1996
  • 3. S. Di Fonzo, W. Jark, S. Lagomarsino, A. Cedola, B. Muller, J.B. Pełka, Thin Solid Films, 287, 288, 1996
  • 4. J. Wang, M.J. Bedzyk, T.L. Penner, M. Caffrey, Nature, 354, 377, 1991
  • 5. D.K.G. De Boer, Phys. Rev. B, 44, 498, 1991
  • 6. L.G. Parratt, Phys. Rev., 95, 359, 1954
  • 7. J.B. Pełka, W. Paszkowicz, M. Brust, C.J. Kiely, M. Knapp, in: HASYLAB Jahresbericht 2000, Vol. I, Eds. W. Dix, T. Kracht, U. Krell, G. Materlik, J.R. Schneider, HASYLAB, Hamurg 2000, p. 461
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv102n219kz
Identifiers
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