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2002 | 102 | 2 | 233-238
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Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction

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The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.
  • Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
  • IESS CNR, V. Cineto Romano 42, 00156 Roma, Italy
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