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2002 | 102 | 2 | 289-294
Article title

Nanostructure of Thin Gold Films Investigated by Means of Atomic Force Microscopy and X-Ray Reflectometry Methods

Content
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Languages of publication
EN
Abstracts
EN
A study of the thin gold film growth, during the deposition on glass substrate under UHV conditions at low temperatures, is presented. The complementary methods, the atomic force microscopy and grazing incidence X-ray reflectometry, are used for the research. It is shown that due to variation of the time of deposition from 2 to 50 min different kinds of thin Au films nanostructures are obtained: from discontinuous films consisting of isolated islands, via formation of the chains of islands, up to continuous films.
Keywords
EN
Year
Volume
102
Issue
2
Pages
289-294
Physical description
Dates
published
2002-08
received
2001-09-23
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv102n215kz
Identifiers
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