PL EN


Preferences help
enabled [disable] Abstract
Number of results
2002 | 102 | 1 | 45-56
Article title

Microstructure Analysis of Nanocrystalline Powders by X-ray Diffraction

Content
Title variants
Languages of publication
EN
Abstracts
EN
The use of X-ray diffraction line profile analysis for the study of nanocrystalline powders is described. The fundamentals of the theory are presented in terms of crystallite/domain size, size distribution, lattice distortion, dislocation density and stacking faults. Line profile parameters and the methods of pattern fitting introduced to overcome the diffraction-line overlap problem are described. The approaches based of the integral breadth of the measured line profiles and the Fourier method are discussed. In addition, simplified approaches are also commented. Representative examples are selected to illustrate various cases of microstructure, such as nanomaterials with strain-free spherical nanocrystallites, strain-free crystallites with anisotropic crystallite shape, anisotropic crystallites with microstrains and spherical crystallites with dislocation densities and crystallite size distributions.
Keywords
Contributors
author
  • Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Av. du Général Leclerc, 35042 Rennes cedex, France
author
  • Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Av. du Général Leclerc, 35042 Rennes cedex, France
References
  • 1. H. Gleiter, J. Appl. Crystallogr., 24, 79, 1991
  • 2. L. Spanhel, M.A. Anderson, J. Am. Chem. Soc., 113, 2826, 1991
  • 3. Y. Wang, N. Herron, Phys. Rev. B, 42, 7253, 1990
  • 4. J.I. Langford, D. Louer, Rep. Prog. Phys., 59, 131, 1996
  • 5. D. Louer, Acta Crystallogr. A, 54, 922, 1998
  • 6. D. Louer, J.P. Auffrédic, J.I. Langford, D. Ciosmak, J.C. Niepce, J. Appl. Crystallogr., 16, 183, 1983
  • 7. T. Ungár, A. Borbély, Appl. Phys. Lett., 69, 3173, 1996
  • 8. P. Scardi, Y.H. Dong, M. Leoni, Mater. Sci. Forum, in press
  • 9. J. Pielaszek, X-Ray Diffractometry in Supported Catalysts Studies, Polska Akad. Nauk, Instytut Chemii Fizycznej, Warszawa 1995
  • 10. R.L. Snyder, J. Fiala, H.J. Bunge, Defect and Microstructure Analysis by Diffraction, IUCr/OUP, Oxford 1999
  • 11. D. Louer, N. Audebrand, Adv. X-ray Anal., 41, 556, 1999
  • 12. Y.H. Dong, P. Scardi, J. Appl. Crystallogr., 33, 184, 2000
  • 13. P. Thompson, D.E. Cox, J.B. Hastings, J. Appl. Crystallogr., 20, 79, 1987
  • 14. P.W. Stephens, J. Appl. Crystallogr., 32, 281, 1999
  • 15. R. Delhez, T.H. de Keijser, J.I. Langford, D. Louer, E.J. Mittemeijer, E.J. Sonneveld, in: The Rietveld Method, Ed. R.A. Young, IUCr/OUP, Oxford 1995, p. 132
  • 16. P. Scardi, M. Leoni, J. Appl. Crystallogr., 32, 671, 1999
  • 17. A. Guinier, Théorie et technique de la radiocristallographie, Dunod, Paris 1956
  • 18. A.J.C. Wilson, X-Ray Optics, Methuen, London 1962
  • 19. E.F. Bertaut, Acta Crystallogr., 3, 14, 1950
  • 20. J.I. Langford, in: Accuracy in Powder Diffraction, Spec. Publ. 846, Eds. E. Prince, J.K. Stalick, NIST, Gaithersburg 1992, p. 110
  • 21. J.I. Langford, D. Louer, J. Appl. Crystallogr., 15, 20, 1982
  • 22. B.E. Warren, X-Ray Diffraction, Addison-Wesley, Reading 1969
  • 23. A.R. Stokes, A.J.C. Wilson, Proc. Phys. Soc. Lond., 56, 174, 1944
  • 24. J.I. Langford, R. Delhez, T.H. de Keijser, E.J. Mittemeijer, Aust. J. Phys., 41, 173, 1988
  • 25. T. Ungár, G. Tichy, Phys. Status Solidi A, 171, 425, 1999
  • 26. P. Klimanek, R. Kuzel, J. Appl. Crystallogr., 21, 59, 1988
  • 27. M.A. Krivoglaz, Theory of X-Ray and Thermal Neutron Scattering by Real Crystals, Plenum Press, New York 1969
  • 28. M. Wilkens, Phys. Status Solidi A, 2, 359, 1970
  • 29. T. Ungár, I. Dragomir, A. Révész, A. Borbély, J. Appl. Crystallogr., 32, 992, 1999
  • 30. G. Ribárik, T. Ungár, J. Gubicza, J. Appl. Crystallogr., in press
  • 31. J.I. Langford, D. Louer, P. Scardi, J. Appl. Crystallogr., 33, 964, 2000
  • 32. J.I. Langford, A. Boultif, J.-P. Auffrédic, D. Louer, J. Appl. Crystallogr., 26, 22, 1993
  • 33. G.K. Williamson, W.H. Hall, Acta Metall., 1, 22, 1953
  • 34. T. Ungár, I. Dragomir-Cernatescu, D. Louer, N. Audebrand, J. Phys. Chem. Solids, 62, 1935, 2001
  • 35. N. Guillou, J.P. Auffrédic, D. Louer, Powder Diffr., 10, 236, 1995
  • 36. N. Audebrand, J.-P. Auffrédic, D. Louer, Chem. Mater., 12, 1791, 2000
  • 37. N. Guillou, L.C. Nistor, H. Fuess, E. Hahn, Nanostruct. Mater., 8, 545, 1997
  • 38. J.-P. Auffrédic, A. Boultif, J.I. Langford, D. Louer, J. Am. Ceram. Soc., 78, 323, 1995
  • 39. D. Louer, R. Vargas, J.P. Auffrédic, J. Am. Ceram. Soc., 67, 136, 1984
  • 40. N. Audebrand, J.P. Auffrédic, D. Louer, Chem. Mater., 10, 2450, 1998
  • 41. N. Audebrand, D. Louer, J. Phys. IV (France), 8, 109, 1988
  • 42. H. Palancher, D. Louer, N. Audebrand, G. Ribárik, T. Ungár, J. Appl. Crystallogr., submitted for publication
  • 43. D. Louer, A. De Guibert, J. Mater. Sci., 20, 3729, 1985
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv102n104kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.