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2002 | 102 | 1 | 7-19
Article title

Investigation of Morphology and Chemical Composition of Self-Organized Semiconductor Quantum Dots and Wires by X-Ray Scattering

Content
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EN
Abstracts
EN
X-ray scattering methods suitable for the investigation of the morphology and chemical composition of self-organized quantum dots and quantum wires are reviewed. Their application is demonstrated in experimental examples showing that a combination of small angle X-ray scattering with high-resolution X-ray diffraction can reveal both the shape and the chemical composition of the self-organized objects.
Keywords
EN
Publisher

Year
Volume
102
Issue
1
Pages
7-19
Physical description
Dates
published
2002-07
received
2001-09-23
Contributors
author
  • Institute of Condensed Matter Physics, Masaryk University, Brno, Czech Republic
author
  • Institute of Condensed Matter Physics, Masaryk University, Brno, Czech Republic
author
  • Institute of Semiconductor Physics, Kepler University, Linz, Austria
author
  • Institute of Semiconductor Physics, Kepler University, Linz, Austria
author
  • Institute of Semiconductor Physics, Kepler University, Linz, Austria
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv102n101kz
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