Investigation of Morphology and Chemical Composition of Self-Organized Semiconductor Quantum Dots and Wires by X-Ray Scattering

• Authors: V. Holý , M. Meduňa , J. Stangl , T. Roch , G. Bauer
• Languages of publication: EN

Abstracts

EN

X-ray scattering methods suitable for the investigation of the morphology and chemical composition of self-organized quantum dots and quantum wires are reviewed. Their application is demonstrated in experimental examples showing that a combination of small angle X-ray scattering with high-resolution X-ray diffraction can reveal both the shape and the chemical composition of the self-organized objects.

Keywords

EN

61.10.-i; 61.10.Dp

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2002
• Volume: 102
• Issue: 1
• Pages: 7-19

Dates

published

2002-07

received

2001-09-23

Contributors

author

V. Holý

• Institute of Condensed Matter Physics, Masaryk University, Brno, Czech Republic

author

M. Meduňa

• Institute of Condensed Matter Physics, Masaryk University, Brno, Czech Republic

author

J. Stangl

• Institute of Semiconductor Physics, Kepler University, Linz, Austria

author

T. Roch

• Institute of Semiconductor Physics, Kepler University, Linz, Austria

author

G. Bauer

• Institute of Semiconductor Physics, Kepler University, Linz, Austria

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Identifiers

DOI

10.12693/APhysPolA.102.7