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2002 | 101 | 5 | 729-734
Article title

Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge

Content
Title variants
Languages of publication
EN
Abstracts
EN
An Si:Ge crystal with approximately 3% of germanium was studied with strongly collimated short-wavelength monochromatic synchrotron beam (beamline E2 at HASYLAB). The topographs obtained in the asymmetric 224 reflection revealed the presence of interference fringes related to growth bands caused by segregation of germanium. The fringes, observed for the first time, were strongly dependent on the angular setting and it was possible to distinguish at least three systems of fringes. A number of features of the existing strain field, which may be important for the formation of the fringes, was determined using other topographic methods, especially the Bragg-case section topography.
Keywords
EN
Year
Volume
101
Issue
5
Pages
729-734
Physical description
Dates
published
2002-05
received
2001-08-31
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv101n517kz
Identifiers
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