Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films

• Authors: A. Burian , A. Jabłońska , A. Burian , D. Le Bolloc'h , H. Metzger , O. Proux , J. Hazemann , A. Mosset , D. Raoux
• Languages of publication: EN

Abstracts

EN

The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In_{50}Se_{50} and Se-In and Se-Se correlations for In_{40}Se_{60} and In_{34}Se_{66} within the first coordination sphere.

Keywords

EN

61.10.-i; 61.43.Dq

Discipline

• 61.43.Dq: Amorphous semiconductors, metals, and alloys

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2002
• Volume: 101
• Issue: 5
• Pages: 701-708

Dates

published

2002-05

received

2001-08-31

Contributors

author

A. Burian

• A. Chełkowski Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland
• Centre of Polymer Chemistry, Polish Academy of Sciences, M. Skłodowskiej-Curie 34, 41-819 Zabrze, Poland

author

A. Jabłońska

• A. Chełkowski Institute of Physics, University of Silesia, Uniwersytecka 4, 40-007 Katowice, Poland

author

A. Burian

• Centre of Polymer Chemistry, Polish Academy of Sciences, M. Skłodowskiej-Curie 34, 41-819 Zabrze, Poland

author

D. Le Bolloc'h

• ESRF, BP 220, 38043 Grenoble, France

author

H. Metzger

• ESRF, BP 220, 38043 Grenoble, France

author

O. Proux

• ESRF, BP 220, 38043 Grenoble, France
• Laboratoire de Crystallographie, UPR CNRS 5031, BP 166X, 38042 Grenoble, France

author

J. Hazemann

• ESRF, BP 220, 38043 Grenoble, France
• Laboratoire de Crystallographie, UPR CNRS 5031, BP 166X, 38042 Grenoble, France

author

A. Mosset

• Laboratoire de Crystallographie, UPR CNRS 5031, BP 166X, 38042 Grenoble, France

author

D. Raoux

• Centre Universitaire Paris-Sud, Bâtiment 209H, BP 34, 91898 Orsay Cedex, France

References

• 1. J.V. McCany, R.B. Murray, J. Phys. C, 10, 1211, 1977
• 2. A. Burian, A.M. Burian, J. Weszka, M. Żelechower, P. Lecante, J. Mater. Sci., 35, 3121, 2000
• 3. A. Jabłońska, A. Burian, A.M. Burian, P. Lecante, A. Mosset, J. Alloys Comp., 328, 214, 2001
• 4. A. Jabłońska, A. Burian, A.M. Burian, J. Szade, O. Proux, J.L. Hazemann, A. Mosset, D. Raoux, J. Non-Cryst. Solids, in press
• 5. S. Sasaki, KEK Report 83-229, Nat. Lab. for High Energy Physics, Tsukuba, Japan, 1984
• 6. A. Burian, P. Lecante, A. Mosset, J. Galy, J.M. Tonnerre, D. Raoux, J. Non-Cryst. Solids, 212, 23, 1997
• 7. A. Aberdam, J. Synchrotron Rad., 5, 1287, 1998
• 8. B.K. Teo, EXAFS: Basic Principles and Data Analysis, Springer-Verlag, Berlin 1986
• 9. G. McKale, B.W. Veal, A.P. Palinkas, S.K. Chen, G.S. Knapp, J. Am. Chem. Soc., 110, 3763, 1988
• 10. T.A. Carlson, Photoelectron and Auger Spectroscopy, Plenum, New York 1975
• 11. E.A. Stern, B. Bunker, S.M. Heald, in: EXAFS Spectroscopy: Techniques and Applications, Eds. B.K. Teo, D.C. Joy, Plenum, New York 1981, p. 59
• 12. R. Joyner, K.J. Martin, P. Meehan, J. Phys. C, 20, 4005, 1987

Identifiers

DOI

10.12693/APhysPolA.101.701