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2002 | 101 | 5 | 701-708
Article title

Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films

Content
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Languages of publication
EN
Abstracts
EN
The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In_{50}Se_{50} and Se-In and Se-Se correlations for In_{40}Se_{60} and In_{34}Se_{66} within the first coordination sphere.
Keywords
EN
Year
Volume
101
Issue
5
Pages
701-708
Physical description
Dates
published
2002-05
received
2001-08-31
References
  • 1. J.V. McCany, R.B. Murray, J. Phys. C, 10, 1211, 1977
  • 2. A. Burian, A.M. Burian, J. Weszka, M. Żelechower, P. Lecante, J. Mater. Sci., 35, 3121, 2000
  • 3. A. Jabłońska, A. Burian, A.M. Burian, P. Lecante, A. Mosset, J. Alloys Comp., 328, 214, 2001
  • 4. A. Jabłońska, A. Burian, A.M. Burian, J. Szade, O. Proux, J.L. Hazemann, A. Mosset, D. Raoux, J. Non-Cryst. Solids, in press
  • 5. S. Sasaki, KEK Report 83-229, Nat. Lab. for High Energy Physics, Tsukuba, Japan, 1984
  • 6. A. Burian, P. Lecante, A. Mosset, J. Galy, J.M. Tonnerre, D. Raoux, J. Non-Cryst. Solids, 212, 23, 1997
  • 7. A. Aberdam, J. Synchrotron Rad., 5, 1287, 1998
  • 8. B.K. Teo, EXAFS: Basic Principles and Data Analysis, Springer-Verlag, Berlin 1986
  • 9. G. McKale, B.W. Veal, A.P. Palinkas, S.K. Chen, G.S. Knapp, J. Am. Chem. Soc., 110, 3763, 1988
  • 10. T.A. Carlson, Photoelectron and Auger Spectroscopy, Plenum, New York 1975
  • 11. E.A. Stern, B. Bunker, S.M. Heald, in: EXAFS Spectroscopy: Techniques and Applications, Eds. B.K. Teo, D.C. Joy, Plenum, New York 1981, p. 59
  • 12. R. Joyner, K.J. Martin, P. Meehan, J. Phys. C, 20, 4005, 1987
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv101n514kz
Identifiers
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