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2001 | 100 | 6 | 859-869
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Direct Ellipsometry Problem for the Substrate-Based Uniaxial Non-Homogeneous Film

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An iterative procedure of calculation of reflectivities and transmission coefficients of light rays for an uniaxial film with a lapse rate of an index of refraction on a uniaxial substrate was gained by orienting the axis of anisotropy along the normal to the boundary. With its help the dependences of ellipsometric anglesΔ andψ for a linear, quadratic, and sine-shaped profiles of refractive indices of a uniaxial immersing film with optic axis oriented along the normal to the boundary were analyzed. The dependences of anglesΔ andψ on quantity of an uptake and anisotropy of the film were also examined. The numerical modelling for ZnO films and Langmuir-Blodgett-like films on a melted quartz was carried out, and this allowed to draw conclusions of practical importance for the ellipsometric investigations of the film structures.
  • Koszalin Technical University, al. Kwiatkowskiego 6-E, 75-343 Koszalin, Poland
  • Department of Laser Physics and Spectroscopy, Belarussian State University, Fr. Skaryna ave. 4, 220050 Minsk, Belarus
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