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2001 | 100 | 5 | 737-742
Article title

Surface Concentration of Defects at Grain Boundaries in Sintered Alumina Determined by Positron Annihilation Lifetime Spectroscopy

Content
Title variants
Languages of publication
EN
Abstracts
EN
Sintered alumina samples of grain diameters spanning from 1.2 to 4.5μm have been investigated by positron annihilation lifetime spectroscopy. One series of samples was produced from material containing about 150 ppm impurities (mainly SiO_2). The second one was made from material having about 2700 ppm of various elements (SiO_2, MgO, CaO). Two models of positron trapping at grain boundaries are compared: The first one relates to the diffusion-limited regime; and the other one - to the transition-limited regime of trapping. As a result the relative change of surface concentration of defects at grain boundaries is determined. Additionally, the positron diffusion constant in bulk alumina at room temperature, D_+=0.36±10 cm^2/s, is estimated.
Keywords
EN
Year
Volume
100
Issue
5
Pages
737-742
Physical description
Dates
published
2001-11
received
2001-05-14
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv100n503kz
Identifiers
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