Preferences help
enabled [disable] Abstract
Number of results
2001 | 100 | 3 | 417-424
Article title

Influence of Built-in Electric Field on Forbidden Transitions in In_xGa_{1-x}As/GaAs Double Quantum Well by Three-Beam Photoreflectance

Title variants
Languages of publication
Photoreflectance spectroscopy has been used to study optical transitions in In_{0.045}Ga_{0.955}As/GaAs double quantum well at 80 K. The derivative nature of this contactless electromodulation technique allows for the observation of excited state transitions in the low-dimensional structure including the symmetry-forbidden ones. Excitonic symmetry-forbidden transitions can be observed due to the effect of mixing of heavy and light hole excitons and/or due to some asymmetry in the structure. We have shown that the built-in electric field in the region of double quantum well is weak enough (less than 0.5 kV/cm) not to cause any significant energetic shift of features due to quantum confined Stark effect, on one hand. On the other hand, it is sufficient to change strongly the oscillator strength of forbidden transitions. To change the internal electric field, we have used photoreflectance in the three-beam mode with a third beam continuously illuminating the sample and causing changes of the built-in electric fields due to the photovoltage effect. This method works as a contactless forward bias and allows for a change of the field down to the flat band conditions. We have shown that changes of built-in electric field by amount of a few tenths of kV/cm can modify the intensity of forbidden transitions significantly. We show that, although the mixing of excitons is still important, a very weak built-in electric field can be dominant in the observation of forbidden excitonic transitions in double quantum well.
Physical description
  • 1. T. Kamizato, M. Matsuura, Phys. Rev. B, 40, 8378, 1989
  • 2. M. Bayer, V.B. Timofeev, F. Faller, T. Gutbrod, A. Forchel, Phys. Rev. B, 54, 8799, 1996
  • 3. M.N. Islam, R.L. Hillman, D.A.B. Miller, D.S. Chemla, A.C. Gossard, J.H. English, Appl. Phys. Lett., 50, 1098, 1987
  • 4. Y. Tokuda, K. Kanamoto, N. Tsukada, Appl. Phys. Lett., 56, 166, 1990
  • 5. Y.J. Chen, E.S. Koteles, B.S. Elman, C.A. Armiento, Phys. Rev. B, 36, 4562, 1987
  • 6. S.R. Andrews, C.M. Murray, A.A. Davies, T.M. Kerr, Phys. Rev. B, 37, 8198, 1988
  • 7. I. Galbraith, G. Duggan, Phys. Rev. B, 40, 5515, 1989
  • 8. M.M. Dignam, J.E. Sipe, Phys. Rev. B, 43, 4084, 1991
  • 9. T. Wang, M. Bayer, A. Forchel, Phys. Rev. B, 58, R10183, 1998
  • 10. T. Wang, M. Bayer, A. Forchel, N.A. Gippius, V. Kulakovskii, Phys. Rev. B, 62, 7433, 2000
  • 11. G. Sęk, K. Ryczko, M. Kubisa, J. Misiewicz, J. Koeth, A. Forchel, Opto-electronics Rev., 7, 117, 1999
  • 12. G. Sęk, K. Ryczko, M. Ciorga, L. Bryja, M. Kubisa, J. Misiewicz, M. Bayer, J. Koeth, A. Forchel, in: Proc. of Advanced Research NATO Workshop on Optical Properties of Semiconductor Nanostructures, Eds. M.L. Sadowski, M. Potemski, M. Grynberg, Kluwer Academic Publishers, Dordrecht 2000, p. 91
  • 13. G. Sęk, K. Ryczko, M. Kubisa, J. Misiewicz, M. Bayer, T. Wang, J. Koeth, A. Forchel, Thin Solid Films, 364, 220, 2000
  • 14. J. Misiewicz, P. Sitarek, G. Sęk, Introduction to the Photoreflectance Spectroscopy of Semiconductor Structures, Oficyna Wydawnicza Politechniki Wrocławskiej, Wrocław 1999, p. 19
  • 15. J. Misiewicz, G. Sęk, P. Sitarek, Optica Applicata, 39, 327, 1999
  • 16. J. Misiewicz, P. Sitarek, G. Sęk, Opto-electronics Rev., 81, 2000
  • 17. G. Bastard, Wave Mechanics Applied to Semiconductor Heterostructures, Les Editions de Physique, Les Ulis 1990
  • 18. G. Arnaud, J. Allegre, P. Lefebvre, H. Mathieu, L.K. Howard, D.J. Dunstan, Phys. Rev. B, 46, 15290, 1992
  • 19. L.C. Andreani, D. De Nova, S. Di Lernia, M. Geddo, G. Guizzetti, M. Patrini, C. Bocchi, A. Bosacchi, C. Ferrari, S. Franchi, J. Appl. Phys., 78, 6745, 1995
  • 20. H. Shen, M. Dutta, J. Appl. Phys., 78, 2151, 1995
Document Type
Publication order reference
YADDA identifier
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.