Structural and Optical Properties of ZnO and Co Doped ZnO Thin Films Prepared by Sol-Gel

• Authors: A. Khantoul , M. Sebais , B. Rahal , B. Boudine , O. Halimi
• Languages of publication: EN

Abstracts

EN

We report on ZnO films doped with different Co concentrations (0, 0.5, and 1 wt%) prepared by sol-gel technique in association with dip-coating onto glass substrates. Zinc acetate dehydrate, cobalt acetate, mono ethanolamine were used as starting materials, as well as solvent and stabilizer, respectively. Nanostructured polycrystalline ZnO thin films with different concentrations of Co doping (0, 0.5, and 1 wt%) are prepared for the first time by the sol-gel method and annealed at 500°C for 1 h. The surface morphologies of the ZnO thin films deposited on glass substrate with different concentrations were evaluated by atomic force microscopy. The optical absorption of the films showed a blue shift of the band gap. The photoluminescence signal of the thin films of undoped and Co-doped ZnO presents different bands in the visible region. The electrical conductivity of the sample with 0.5%Co was found to be 4.62 (ΩCm)¯¹.

Keywords

EN

Co doped ZnO; XRD; nanometric size; photoluminescence

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2018
• Volume: 133
• Issue: 1
• Pages: 114-117

Dates

published

2018-01

received

2017-10-05

(unknown)

2017-12-10

Contributors

author

A. Khantoul

• Crystallography Laboratory, Physics Department, Faculty of Exact Sciences, Mentouri Brothers University, Route Ain El Bey, Constantine 25000, Algeria

author

M. Sebais

• Crystallography Laboratory, Physics Department, Faculty of Exact Sciences, Mentouri Brothers University, Route Ain El Bey, Constantine 25000, Algeria

author

B. Rahal

• Spectrometry Department, Nuclear Technical Division, Nuclear Research Center of Algiers, 2 Bd., Frantz Fanon, BP 399, Algiers 16000, Algeria.

author

B. Boudine

• Crystallography Laboratory, Physics Department, Faculty of Exact Sciences, Mentouri Brothers University, Route Ain El Bey, Constantine 25000, Algeria

author

O. Halimi

• Crystallography Laboratory, Physics Department, Faculty of Exact Sciences, Mentouri Brothers University, Route Ain El Bey, Constantine 25000, Algeria

References

• [1] D.C. Look, Mater. Sci. Eng. B 80, 383 (2001), doi: 10.1016/S0921-5107(00)00604-8
• [2] K. Ellmer, A. Klein, in: Transparent Conductive Zinc Oxide - Basics and Applications in Thin Film Solar Cells, Springer Series in Materials Science, Vol. 104, Springer-Verlag, Berlin 2008, p. 1
• [3] J.L. Chen, D. Chen, Z.H. Chen, Sci. China Ser. E Tech. Sci. 52, 88 (2009), doi: 10.1007/s11431-009-0002-y
• [4] Z.L. Wang, J. Phys. Condens. Matter 16, R829 (2004), doi: 10.1088/0953-8984/16/25/R01
• [5] K. Nakahara, H. Takasu, P. Fons, A. Yamada, K. Iwata, K. Matsubara, R. Hunger, S. Niki, Appl. Phys. Lett. 79, 4139 (2001), doi: 10.1016/j.mspro.2015.06.050
• [6] C. Gumus, O.M. Ozkendir, H. Kavak, Y.J. Ufuktepe, Optoelectron. Adv. Mater. 8, 299 (2006)
• [7] M. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, P. Yang, Science 292, 1897 (2001), doi: 10.1126/science.1060367
• [8] J. Song, S.A. Kulinich, J. Yan, Z. Li, J. He, C. Kan, H. Zeng, Adv. Mater. 25, 5750 (2013), doi: 10.1002/adma.201302293
• [9] L. Ma, X. Ai, X. Huang, S. Ma, Superlatt. Microstruct. 50, 703 (2011), doi: 10.1016/j.spmi.2011.09.012
• [10] C. Pan, L. Dong, G. Zhu, S. Niu, R. Yu, Q. Yang, Y. Liu, Z.L. Wang, Nat. Photon 7, 752 (2013), doi: 10.1038/nphoton.2013.191
• [11] C. Bundesmann, R. Schmidt-Grund, M. Schubert, in: Transparent Conductive Zinc Oxide, Basics and Applications in Thin Film Solar Cells, Eds. K. Ellmer, A. Klein, B. Rech, Springer Series in Materials Science, Vol. 104, Springer-Verlag, Berlin 2008, p. 79
• [12] E.K. Ellmer, A. Klein, B. Rech, Transparent Conductive Zinc Oxide, Eds. K. Ellmer, A. Klein, B. Rech, Springer Series in Materials Science, Vol. 104, Springer-Verlag, Berlin 2008
• [13] P.A. Rodnyš, I.V. Khodyuk, E.I. Gorokhova, S.B. Mikhrin, P. Dorenbos, Opt. Spectr. 105, 908 (2008), doi: 10.1134/S0030400X08120151
• [14] S.W. Kim, S. Fujita, H.K. Park, B. Yang, H.K. Kim, D.H. Yoon, J. Cryst. Growth 292, 306 (2006), doi: 10.1016/j.jcrysgro.2006.04.026
• [15] J. Hu, R. Gordon, Sol. Cells 30, 437 (1991), doi: 10.1063/1.1773372
• [16] R.E. Marotti, D.N. Guerra, C. Bello, G. Machado, E.A. Dalchiele, Sol. Energy Mater. Sol. Cells 82, 85 (2004), doi: 10.1016/j.solmat.2004.01.008
• [17] J. Zhao, L.Z. Hu, Z.Y. Wang, Y. Zhao, X.P. Liang, Appl. Surf. Sci. 22, 311 (2004), doi: 10.1016/j.apsusc.2004.02.010
• [18] K. Vinod, R.G. Singh, L.P. Purohit, R.M. Mehra, J. Mater. Sci. Technol. 27, 481 (2011), doi: 10.1016/S1005-0302(11)60095-9
• [19] R. Jayakrishnan, R. Sreekumar, K. Mohanachandran, C. Sudha Kartha, K.P. Vijayakumar, Mater. Sci. Semicond. Process. 16, 326 (2013), doi: 10.1016/j.mssp.2012.10.003
• [20] Qing Hua Li, Deliang Zhu, Wenjun Liu, Yi, Lin, Xiao Cui Ma, Appl. Surf. Sci. 254, 2922 (2008), doi: 10.1016/j.apsusc.2007.09.104
• [21] M.H. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, P. Yang, Science 292, 1897 (2001), doi: 10.1126/science.1060367
• [22] A. Raidou, M. Aggour, A. Qachaou, L. Laanab, M. Fahoume, J. Condens. Mater. 12, 125 (2010), doi: 10.1063/1.4980466
• [23] V. Shelke, B.K. Sonawane, M.P. Bhole, D.S. Patil, J. Mater. Sci. 23, 451 (2012), doi: 10.1007/s10854-011-0462-2
• [24] Y. Caglar, J. Alloys Comp. 560, 181 (2013), doi: 10.1016/j.jallcom.2013.01.080
• [25] B.E. Warren, X-Ray Diffraction, Dover, New York 1990, p. 1
• [26] S. Karuppuchamy, J.-M. Jeong, D.P. Amalnerkar, H. Minoura, Vacuum 80, 494 (2006), doi: 10.1016/j.vacuum.2005.06.005
• [27] V. Jokanovic, A.M. Spasic, D. Uskokovic, J. Coll. Interface Sci. 278, 342 (2004), doi: 10.1016/j.jcis.2004.06.008
• [28] D.M. Carballeda-Galicia, R. Castanedo-Pérez, O. Jiménez-Sandoval, S. Jiménez-Sandoval, G. Tores-Dalgado, C.L. Zũńiga-Romero, Thin Solid Films 371, 105 (2000), doi: 10.1016/S0040-6090(00)00987-1
• [29] L. Schmidt-Mende, J.L. MacManus-Driscoll, Materials Today 10, 40 (2007), doi: 10.1016/S1369-7021(07)70078-0

Identifiers

DOI

10.12693/APhysPolA.131.114