PL EN


Preferences help
enabled [disable] Abstract
Number of results
2018 | 133 | 1 | 28-31
Article title

Thermal Lensing Compensation in the Development of 30 fs Pulse Duration Chirped Pulse Amplification Laser System and Single-Shot Intensity-Phase Measurement

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
We present 30 fs pulse duration home-made chirped pulse amplification Ti:sapphire laser system operating at a repetition rate of 1 kHz with 4.0 mJ pulse energy. The Ti:sapphire laser system with ım819 nm center wavelength has a long-cavity oscillator, four pass grating stretcher, 8-pass pre-amplifier, 4-pass post-amplifier and a double pass grating compressor. The Peltier coolers and thermal eigenmode post-amplifier are introduced to compensate the thermal lensing of the crystal in the amplifiers and to enhance the beam focusability on the crystal. The Strehl ratio and M² value measured by employing the Shack-Hartman wavefront sensor HASO4 to observe the spatial profile and beam quality. The most sensitive single-shot second harmonic generation frequency-resolved optical gating diagnostic technique is employed to characterize intensity and phase of the output compressed laser pulses.
Publisher

Year
Volume
133
Issue
1
Pages
28-31
Physical description
Dates
published
2018-01
received
2016-06-27
(unknown)
2017-11-19
Contributors
author
  • Department of Physics and Astronomy, College of Science, King Saud University, Riyadh, 11541, Saudi Arabia
author
  • GoLP/Instituto de Plasmas e Fusăo Nuclear, Instituto Superior Técnico, Universidade de Lisboa, Av. Rovisco Pais, 1049-001 Lisbon, Portugal
References
  • [1] U.O. Farrukh, A.M. Buoncristiani, C.E. Byvik, IEEE J. Quantum Electron. 24, 2253 (1988), doi: 10.1109/3.8568
  • [2] M.E. Innocenzi, H.T. Yura, C.L. Fincher, R.A. Fields, Appl. Phys. Lett. 56, 1831 (1990), doi: 10.1063/1.103083
  • [3] C. Pfistner, R. Weber, H.P. Weber, S. Merazzi, R. Gruber, IEEE J. Quantum Electron. 30, 1605 (1994), doi: 10.1109/3.299492
  • [4] J. Tapping, M.L. Reilly, JOSA A 3, 610 (1986), doi: 10.1364/JOSAA.3.000610
  • [5] J. Sung, T. Jeong, S. Lee, T. Yu, I. Choi, J. Lee, J. Kor. Phys. Soc. 55, 495 (2009), doi: 10.3938/jkps.55.495
  • [6] A. Börzsönyi, R.S. Nagymihály, K. Osvay, Laser Phys. Lett. 13, 015301 (2015), doi: 10.1088/1612-2011/13/1/015301
  • [7] G. Wagner, V. Wulfmeyer, A. Behrendt, Appl. Opt. 50, 5921 (2011), doi: 10.1364/AO.50.005921
  • [8] P. Hello, J.Y. Vinet, Phys. Lett. A 178, 351 (1993), doi: 10.1016/0375-9601(93)90860-3
  • [9] T. Tomaru, T. Suzuki, S. Miyoki, T. Uchiyama, C.T. Taylor, A. Yamamoto, T. Shintomi, M. Ohashi, K. Kuroda, Clas. Quant. Grav. 19, 2045 (2002), doi: 10.1088/0264-9381/19/7/412
  • [10] D. Blair, F. Cleva, C.N. Man, Opt. Mater. 8, 233 (1997), doi: 10.1016/S0925-3467(97)00044-X
  • [11] T.J. Yu, S.K. Lee, J.H. Sung, J.W. Yoon, T.M. Jeong, J. Lee, Opt. Expr. 20, 10807 (2012), doi: 10.1364/OE.20.010807
  • [12] T. Imran, M. Hussain, G. Figueira, Laser Phys. Lett. 13, 066101 (2016), doi: 10.1088/1612-2011/13/6/066101
  • [13] V.P. Kandidov, O.G. Kosareva, I.S. Golubtsov, W. Liu, A. Becker, N. Akozer, C.M. Bowden, S.L. Chin, Appl. Phys. B Lasers Opt. 77, 149 (2003), doi: 10.1007/s00340-003-1214-7
  • [14] H.G. Roskos, M.D. Thomson, M. Kreß , T. Loffler, Laser Photon. Rev. 1, 349 (2007), doi: 10.1002/lpor.200710025
  • [15] J.H. Sung, S.K. Lee, T.J. Yu, T.M. Jeong, J. Lee, Opt. Lett. 35, 3021 (2010), doi: 10.1364/OL.35.003021
  • [16] Y. Chu, X. Liang, L. Yu, Y. Xu, L. Xu, L. Ma, X. Lu, Y. Liu, Y. Leng, R. Li, Z. Xu, Opt. Expr. 21, 29231 (2013), doi: 10.1364/OE.21.029231
  • [17] R. Salin, C.L. Blanc, J. Squier, C. Barty, Opt. Lett. 23, 718 (1998), doi: 10.1364/OL.23.000718
  • [18] G. Matras, N. Huot, E. Baubeau, E. Audouard, Opt. Expr. 15, 7528 (2007), doi: 10.1364/OE.15.007528
  • [19] I.H. Baek, H.W. Lee, S. Bae, B.H. Hong, Y.H. Ahn, D.I. Yeom, F. Rotermund, Appl. Phys. Expr. 5, 032701 (2012), doi: 10.1143/APEX.5.032701
  • [20] R. Nagymihály, P. Jojart, A. Borzsonyi, K. Osvay, in: High Intensity Lasers and High Field Phenomena, Optical Society of America, HS3B-4, 2016
  • [21] K.H. Hong, Y.H. Cha, C.H. Nam, J.D. Park, J. Kor. Phys. Soc. 33, 315 (1998)
  • [22] R. Trebino, K.W. Delong, D.N. Fittinghoff, J.N. Sweetser, M.A. Krumbügel, B.A. Richman, D.J. Kane, Rev. Sci. Instrum. 68, 3277 (1997), doi: 10.1063/1.1148286
  • [23] T. Imran, M. Hussain, G. Figueira, Microwave Opt. Technol. Lett. 59, 3155 (2017), doi: 10.1002/mop.30894
  • [24] K.H. Hong, J.H. Sung, Y.S. Lee, C.H. Nam, Opt. Commun. 213, 193 (2002), doi: 10.1016/S0030-4018(02)02085-0
  • [25] Y. Takao, T. Imasaka, Y. Kida, T. Imasaka, Appl. Sci. 5, 136 (2015), doi: 10.3390/app5020136
  • [26] J.H. Sung, K.H. Hong, Y.H. Cha, C.H. Nam, Jpn. J. Appl. Phys. 41, L931 (2002), doi: 10.1143/JJAP.41.L931
  • [27] G. Cheriaux, P. Rousseau, F. Salin, J. Chambaret, B. Walker, L. Dimauro, Opt. Lett. 21, 414 (1996), doi: 10.1364/OL.21.000414
  • [28] J.H. Sung, K.H. Hong, C.H. Nam, J. Kor. Opt. Soc. 7, 135 (2003), doi: 10.3807/JOSK.2003.7.3.135
  • [29] C. Le Blanc, E. Baubeau, F. Salin, J.A. Squier, C.P.J. Barty, C. Spielmann, IEEE J. Select. Top. Quant. Electron. 4, 407 (1998), doi: 10.1109/2944.686748
  • [30] C.G. Durfee, S. Backus, M.M. Murnane, H.C. Kapteyn, IEEE J. Quant. Electron. 4, 395 (1998), doi: 10.1109/2944.686747
  • [31] D.J. Kane, R. Trebino, IEEE J. Quant. Electron. 29, 571 (1993), doi: 10.1109/3.199311
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-app133z1p07kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.