Positronium time-of-flight Measurements of Mesoporous Silica Films

• Authors: Peng Kuang , Xiao Zhang , Chun He , Xing Cao , Bao Wang
• Languages of publication: EN

Abstracts

EN

Mesoporous silica films were synthesized with various concentrations of cetyltrimethylammonium bromide (CTAB) in precursor sols through the method of electro-assisted self-assembly (EASA). Oriented pore channels were observed in the films prepared with more CTAB in the precursor sols. Positronium time-of-flight (Ps-TOF) measurements were performed for the silica films with different porous structures. It is demonstrated that the Ps emission intensity and energies are well correlated to the apparent porosity, pore interconnectivity and possibly pore channel orientation. The results indicate that Ps-TOF can be a useful technique for probing the structures of porous films.

Keywords

EN

78.70.Bj; 61.05.-a; 68.47.Mn

Discipline

• 68.47.Mn: Polymer surfaces
• 78.70.Bj: Positron annihilation(for positron states, see 71.60.+z in electronic structure of bulk materials; for positronium chemistry, see 82.30.Gg in physical chemistry and chemical physics)
• 61.05.-a: Techniques for structure determination

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2018
• Volume: 133
• Issue: 1
• Pages: 3-6

Dates

published

2018-01

Contributors

author

Peng Kuang

• Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

author

Xiao Zhang

• School of Physics and Technology, Wuhan University, Wuhan 430072, China

author

Chun He

• School of Physics and Technology, Wuhan University, Wuhan 430072, China

author

Xing Cao

• Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

author

Bao Wang

• Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

References

• [1] C. Sanchez, B. Julian, P. Belleville, M. Popall, J. Mater. Chem. 15, 3559 (2005), doi: 10.1039/b509097k
• [2] B.J. Scott, G. Wirnsberger, G.D. Stucky, Chem. Mater. 13, 3140 (2001), doi: 10.1021/cm0110730
• [3] M. Hartmann, Chem. Mater. 17, 4577 (2005), doi: 10.1021/cm0485658
• [4] A. Walcarius, E. Sibottier, M. Etienne, J. Ghanbaja, Nat. Mater. 6, 602 (2007), doi: 10.1038/nmat1951
• [5] C. Sanchez, C. Boissiere, D. Grosso, C. Laberty, L. Nicole, Chem. Mater. 20, 682 (2008), doi: 10.1021/cm702100t
• [6] P. Sferlazzo, S. Berko, K. F. Canter, Phys. Rev. B 35, 5315 (1987), doi: 10.1103/PhysRevB.35.5315
• [7] A.P. Mills, E.D. Shaw, R.J. Chichester, D.M. Zuckerman, Phys. Rev. B 40, 2045 (1989), doi: 10.1103/PhysRevB.40.2045
• [8] Y. Nagashima, Y. Morinaka, T. Kurihara, Y. Nagai, T. Hyodo, T. Shidara, K. Nakahara, Phys. Rev. B 58, 12676 (1998), doi: 10.1103/PhysRevB.58.12676
• [9] A. Rich, Rev. Mod. Phys. 53(1), 127 (1981), doi: 10.1103/RevModPhys.53.127
• [10] R.S. Yu, T. Ohdaira, R. Suzuki, K. Ito, K. Hirata, K. Sato, Y. Kobayashi, Appl. Phys. Lett. 83, 4966 (2003), doi: 10.1063/1.1634380
• [11] D.W. Gidley, W.E. Frieze, T.L. Dull, A.F. Yee, E.T. Ryan, H.-M. Ho, Phys. Rev. B 60, R5157 (1999), doi: 10.1103/PhysRevB.60.R5157
• [12] C. He, T. Ohdaira, N. Oshima, M. Muramatsu, A. Kinomura, R. Suzuki, T. Oka, Y. Kobayashi, Phys. Rev. B 75, 195404 (2007), doi: 10.1103/PhysRevB.75.195404
• [13] C. He, S. Wang, Y. Kobayashi, T. Ohdaira, R. Suzuki, Phys. Rev. B 86, 075415 (2012), doi: 10.1103/PhysRevB.86.075415
• [14] A. Goux, M. Etienne, E. Aubert, C. Lecomte, J. Ghanbaja, A. Walcarius, Chem. Mater. 21(4), 731 (2009), doi: 10.1021/cm8029664
• [15] P. Revol, D. Perret, F. Bertin, F. Fusalba, V. Rouessac, A. Chabli, G. Passemard, A. Ayral, J. Porous Mater. 113, 12 (2005), doi: 10.1007/s10934-005-6768-9

Identifiers

DOI

10.12693/APhysPolA.131.3