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2010 | 65 | 9-19
Article title

Transmission Electron Microscopy as indispensable tool for imaging and chemical characterization of heterogeneous catalysts

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Content
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Languages of publication
EN
Abstracts
EN
Transmission Electron Microscopy (TEM) and its mutation Scanning Transmission Electron Microscopy (STEM) is one of the most important methods providing unique information on structure and chemistry of solid catalysts at length scale down to level. The principal reason is its high spatial resolution (below 0.1 nm) but also universality, i.e., ability of observation of both images and diffraction patterns of individual nanometer size objects. Recent advances in TEM in particular application of image and beam correctors, possibility of studying specimens at non vacuum conditions (environmental TEM) and possibility of dynamic (time resolved) studies even further broadened the applicability of the method in catalysis.
Keywords
Year
Volume
65
Pages
9-19
Physical description
Dates
published
1 - 1 - 2010
online
28 - 1 - 2011
Contributors
author
  • Division of Nanomaterials Chemistry and Catalysis, Institute of Low Temperature and Structure Research, Polish Academy of Sciences, Okólna 2, 50-412 Wrocław, Poland
References
  • Electron Diffraction Techniques. ed. by J. M. Cowley, Oxford University Press, Oxford, 1992 vol. I and II.
  • W. Qin and P. Fraundorf, Ultramicroscopy 94, 245 (2003).
  • D. Potoczna-Petru and L. Kępiński, Catal. Lett., 73, 41 (2001).
  • L. Kępiński and M. Wołcyrz, J. Solid State Chem., 131, 121 (1997).
  • M. Varela, A. R. Lupini, K. van Benthem, A. Y. Borisevich, M. F. Chisholm, N. Shibata, E. Abe and S. J. Pennycook, Annu. Rev. Mater. Res. 35, 539 (2005).
  • A. A. Herzing, C. J. Kiely, A. F. Carley, P. Landon and G. J. Hutchings, Science 321 1331 (2008).
  • H. Friedrich, P. E. De Jongh, A. J. Verkleij and K. P. De Jong, Chem. Rev., 109 1613 (2009).
  • L. Kępiński, B. Stasińska and T. Borowiecki, Carbon 38, 1845 (2000).
  • A. Basińska, L. Kępiński and F. Domka, Appl. Catal. A. 183, 143 (1999).
  • A. Avilov, K. Kuligin, S. Nicolopoulos, M. Nickolskiya, K. Boulahya, J. Portillo, G. Lepeshov, B. Sobolev, J. P. Collette, N. Martin, A. C. Robins, P. Fischione. Ultramicroscopy 107, 431 (2007).
  • J. C. H. Spence, Experimental High Resolution Electron Microscopy, Oxford University Press, Oxford, 1989.
  • M. Lentzen, B. Jahnen, C. L. Jia, A. Thust, K. Tillmann, and K. Urban, Ultramicroscopy 92, 233 (2002).
  • D. S. Su, et al. Angew. Chem.-Int. Ed. 47, 5005 (2008).
  • M. Małecka and L. Kępiński, J. Microscopy-Oxford 237, 282 (2010).
  • J. Liu, in Nanotechnology in Catalysis (B. Zhou, S. Hermans and G. Somorjai eds.) vol 2, Kluwer Academic, New York 2004, p. 361.
  • P. A. Gai and E. D. Boyes, Microscopy Research and Technique, 72, 153 (2009).
  • A. H. Zewail and J. M. Thomas, 4D Electron Microscopy: Imaging in Time and Space, Imperial College Press, London 2009.
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.-psjd-doi-10_2478_v10063-010-0002-6
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