PL EN


Preferences help
enabled [disable] Abstract
Number of results
2010 | 12 | 4 | 62-63
Article title

Enhancement of XPS surface sensitivity in nanocrystalline material

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.
Keywords
Publisher
Year
Volume
12
Issue
4
Pages
62-63
Physical description
Dates
published
1 - 1 - 2010
online
28 - 12 - 2010
References
  • Tougaard, S. (2005). XPS for Quantitative Analysis of Surface Nano-structures. Microsc. Microanal. 11(2), 676-677. DOI:10.1017/S1431927605500229.[PubMed][Crossref]
  • Jablonski, A. & Powell, C. J. (2004). Electron effective attenuation lengths in electron spectroscopies, J. Alloy. Compd. 362, 26-32. DOI:10.1016/S0925-8388(03)00558-9.[Crossref]
  • Gunter, P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19, 161-164. DOI: 10.1002/sia.740190131.[Crossref]
  • Suchorski, Y., Wrobel, R., Becker, S., Opalinska, A., Narkiewicz, U., Podsiadly, M. & Weiss, H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study, Acta Phys Pol A, 114, 125 0150 134.
  • Briggs, D. (2005). Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, Cambridge University Press.
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.-psjd-doi-10_2478_v10026-010-0052-8
Identifiers
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.