Enhancement of XPS surface sensitivity in nanocrystalline material

• Authors: Rafal Wróbel
• Languages of publication: EN

Abstracts

EN

The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.

Keywords

EN

XPS   nanomaterials   surface science  

• Publisher: De Gruyter Open
• Journal: Polish Journal of Chemical Technology
• Year: 2010
• Volume: 12
• Issue: 4
• Pages: 62-63

Dates

published

1 - 1 - 2010

online

28 - 12 - 2010

References

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• Gunter, P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19, 161-164. DOI: 10.1002/sia.740190131.[Crossref]
• Suchorski, Y., Wrobel, R., Becker, S., Opalinska, A., Narkiewicz, U., Podsiadly, M. & Weiss, H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study, Acta Phys Pol A, 114, 125 0150 134.
• Briggs, D. (2005). Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, Cambridge University Press.

Identifiers

DOI

10.2478/v10026-010-0052-8