Silicon solar cells with Al2O3 antireflection coating

• Authors: Leszek Dobrzański , Marek Szindler , Aleksandra Drygała , Magdalena Szindler
• Languages of publication: EN

Abstracts

EN

The paper presents the possibility of using Al2O3 antireflection coatings deposited by atomic layer deposition ALD. The ALD method is based on alternate pulsing of the precursor gases and vapors onto the substrate surface and then chemisorption or surface reaction of the precursors. The reactor is purged with an inert gas between the precursor pulses. The Al2O3 thin film in structure of the finished solar cells can play the role of both antireflection and passivation layer which will simplify the process. For this research 50×50 mm monocrystalline silicon solar cells with one bus bar have been used. The metallic contacts were prepared by screen printing method and Al2O3 antireflection coating by ALD method. Results and their analysis allow to conclude that the Al2O3 antireflection coating deposited by ALD has a significant impact on the optoelectronic properties of the silicon solar cell. For about 80 nm of Al2O3 the best results were obtained in the wavelength range of 400 to 800 nm reducing the reflection to less than 1%. The difference in the solar cells efficiency between with and without antireflection coating was 5.28%. The LBIC scan measurements may indicate a positive influence of the thin film Al2O3 on the bulk passivation of the silicon.

Keywords

EN

photovoltaic; silicon solar cell; atomic layer deposition; antireflection coating

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2014
• Volume: 12
• Issue: 9
• Pages: 666-670

Dates

published

1 - 9 - 2014

online

31 - 7 - 2014

Contributors

author

Leszek Dobrzański

• Institute of Engineering Materials and Biomaterials, Silesian University of Technology, Konarskiego 18a Str., 44-100, Gliwice, Poland

author

Marek Szindler

• Institute of Engineering Materials and Biomaterials, Silesian University of Technology, Konarskiego 18a Str., 44-100, Gliwice, Poland

author

Aleksandra Drygała

• Institute of Engineering Materials and Biomaterials, Silesian University of Technology, Konarskiego 18a Str., 44-100, Gliwice, Poland

author

Magdalena Szindler

• Institute of Engineering Materials and Biomaterials, Silesian University of Technology, Konarskiego 18a Str., 44-100, Gliwice, Poland

References

• [1] L. A. Dobrzański et al., J. Mater. Process. Tech. 201, 291 (2008) http://dx.doi.org/10.1016/j.jmatprotec.2007.11.278[Crossref]
• [2] L. A. Dobrzański, A. Drygała, JAMME 31, 77 (2008)
• [3] J. Zhao, M. A. Green, IEEE T. Electron Dev. 38, 1925 (1991) http://dx.doi.org/10.1109/16.119035[Crossref]
• [4] S. K. Dhungel et al., J. Korean Phys. Soc. 49, 885 (2006)
• [5] K. Jinkuk et al., 30, 41 (2013)
• [6] R. Kishore, S. N. Singh, B. K. Das, Renew. Ener. 12, 131 (1997) http://dx.doi.org/10.1016/S0960-1481(97)00030-X[Crossref]
• [7] C. C. Johnson, T. Wydeven, K. Donohoe, Sol. Energy. 31, 355 (1983) http://dx.doi.org/10.1016/0038-092X(83)90133-0[Crossref]
• [8] C. R. Lin, D. H. Wei, C. K. Chang, W. H. Liao, Phys. Procedia 18, 46 (2011) http://dx.doi.org/10.1016/j.phpro.2011.06.055[Crossref]
• [9] P. Violet, E. Blanquet, D. Monnier, I. Nuta, C. Chatillon, Surf. Coat. Technol. 204, 882 (2009) http://dx.doi.org/10.1016/j.surfcoat.2009.08.022[Crossref]
• [10] A. Szeghalmi et al, Appl. Opt. 48, 1727 (2009) http://dx.doi.org/10.1364/AO.48.001727[Crossref]
• [11] B. Brennan, H. Dong, D. Zhernokletov, J. Kim, R. M. Wallace, Appl. Phys. Express 4, 125701 (2011) http://dx.doi.org/10.1143/APEX.4.125701[Crossref]
• [12] L. A. Dobrzański, K. Lukaszkowicz, D. Pakuła, J. Mikuła, AMSE 28, 12 (2007)
• [13] M. Chwastek, J. Weszka, J. Jurusik, B. Hajduk, P. Jarka, AMSE 48, 69 (2011)
• [14] J. Weszka et al., JAMME 49, 224 (2011)
• [15] J. Weszka, M. Śzindler, A. Sliwa, B. Hajduk, J. Jurusik, AMSE 48, 40 (2011)
• [16] W. Liang et al., Phot. IEEE J. 3, 678 (2013) http://dx.doi.org/10.1109/JPHOTOV.2012.2235525[Crossref]
• [17] S.-K. Oh et al., J. Semicond. Sci. Tech. 13, 581 (2013) http://dx.doi.org/10.5573/JSTS.2013.13.6.581[Crossref]
• [18] V. Naumann et al., Energy Procedia 27, 312 (2012) http://dx.doi.org/10.1016/j.egypro.2012.07.069[Crossref]
• [19] K.-H. Kim et al., Phys. Status Solidi Rapid Res. Lett. 5, 202 (2011) http://dx.doi.org/10.1002/pssr.201105188[Crossref]

Identifiers

DOI

10.2478/s11534-014-0500-9