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2014 | 12 | 8 | 559-564
Article title

Study of the surface relaxation and single vacancy formation in very thin Cu (001) film by using MAEAM

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EN
Abstracts
EN
The surface relaxation and the formation of a single vacancy in very thin Cu (001) film formed by 2 ∼ 14 atomic layers have been studied by using MAEAM and MD simulation. For the surface relaxtion, the highest surface energy is in the l = 2 atomic layers. The multilayer relaxation mainly occurs between the first two atomic layers, and the maximum contractive displacement is obtained in the very thin Cu (001) film formed by l = 3 atomic layers. For the vacancy formed in l′ = 1 of the very thin Cu (001) film formed by l = 2 ∼ 14 layers, the most difficult site in the film formed by l = 3 atomic layers.
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Publisher

Journal
Year
Volume
12
Issue
8
Pages
559-564
Physical description
Dates
published
1 - 8 - 2014
online
20 - 7 - 2014
Contributors
author
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.-psjd-doi-10_2478_s11534-014-0489-0
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