PL EN


Preferences help
enabled [disable] Abstract
Number of results
Journal
2013 | 11 | 2 | 239-244
Article title

Influence of terbium on structure and luminescence of nanocrystalline TiO2 thin films

Content
Title variants
Languages of publication
EN
Abstracts
EN
In this work analysis of the structural and optical properties of TiO2 thin films doped with terbium has been described. Samples were prepared by a high energy reactive magnetron sputtering process under low pressure of oxygen plasma. X-ray diffraction results have shown that different TiO2 crystal forms have been produced, depending on the amount of Tb dopant. The undoped matrix had rutile structure with crystallites with a size of 8.7 nm, while incorporation of 0.4 at. % of Tb into the film during the sputtering process resulted in anatase structure with bigger crystallites (11.7 nm). Increasing the amount of terbium up to 2 at. % and 2.6 at. % gave rutile structure with crystallites with a size of 6.6 nm for both films. However, Raman spectroscopy has revealed that in the case of TiO2:(2 at. % Tb), except for the rutile form, the presence of fine-crystalline anatase was observed. Moreover, the lack of Raman peaks shift attests to the lack of stress in the titania lattice of all of the TiO2:Tb films. This fact indicates localization of Tb3+ ions on the surface of TiO2 nanocrystals. In the case of optical investigation, results have shown that doping with terbium has a significant influence on the properties of TiO2, but it does not decrease the high transparency of the matrix. The observed changes of the transmission characteristics were produced only due to modification of the TiO2:Tb structure. Photoluminescence measurements have shown that emission of light from TiO2:Tb films occurs when the amount of terbium is 2.6 at. %. Based on the obtained results a scheme of direct energy transfer from titanium dioxide matrix (with rutile structure) to Tb3+ ions has been proposed.
Publisher
Journal
Year
Volume
11
Issue
2
Pages
239-244
Physical description
Dates
published
1 - 2 - 2013
online
9 - 2 - 2013
References
  • [1] K. L. Frindell et al., J. Solid State Chem. 172, 81 (2003) http://dx.doi.org/10.1016/S0022-4596(02)00126-3[Crossref]
  • [2] M. R. Hoffmann, S. T. Martin, W. Choi, D. W. Bahnemann, Chem. Rev. 95, 69 (1995) http://dx.doi.org/10.1021/cr00033a004[Crossref]
  • [3] C. Y. Li, Q. Su, J. Qiu, Chin. J. Lumin. 24, 19 (2003)
  • [4] P. M. Kumar, S. Badrinarayanan, M. Sastry, Thin Solid Films 358, 122 (2000) http://dx.doi.org/10.1016/S0040-6090(99)00722-1[Crossref]
  • [5] M. Saquib, M. Muneer, Dyes Pigments 53, 237 (2002) http://dx.doi.org/10.1016/S0143-7208(02)00024-4[Crossref]
  • [6] B. K. Moon et al., J. Lumin. 122, 873 (2007) http://dx.doi.org/10.1016/j.jlumin.2006.01.313[Crossref]
  • [7] M. Zalewska, A. M. KŁonkowski, Opt. Mater. 30, 725 (2008) http://dx.doi.org/10.1016/j.optmat.2007.02.021[Crossref]
  • [8] Y. Xie et al., Appl. Phys. Let. 97, 141916 (2010) http://dx.doi.org/10.1063/1.3496471[Crossref]
  • [9] T. Hikita, T. Sado, K. Kawano, J. Alloy. Compd. 408, 886 (2006) http://dx.doi.org/10.1016/j.jallcom.2005.01.100[Crossref]
  • [10] Z. Yuan et al., J. Alloy. Compd. 474, 246 (2009) http://dx.doi.org/10.1016/j.jallcom.2008.06.054[Crossref]
  • [11] Y. Sheng et al., Thin Solid Films 519, 7966 (2011) http://dx.doi.org/10.1016/j.tsf.2011.05.009[Crossref]
  • [12] C. Jia et al., Thin Solid Films 496, 555 (2006) http://dx.doi.org/10.1016/j.tsf.2005.08.378[Crossref]
  • [13] E. Comini et al., Sensor. Actuat. B-Chem. 108, 21 (2005) http://dx.doi.org/10.1016/j.snb.2004.10.041[Crossref]
  • [14] H. Choi, J. H. Kim, S. Yi, B. K. Moon, J. H. Jeong, J. Alloy. Compd. 408, 816 (2006) http://dx.doi.org/10.1016/j.jallcom.2005.01.067[Crossref]
  • [15] B. K. Moon et al., Opt. Mater. 28, 676 (2006) http://dx.doi.org/10.1016/j.optmat.2005.09.042[Crossref]
  • [16] A. Conde-Gallardo, M. Garcia-Rocha, R. Palomino- Merino, M. P. Velasquez-Queasda, I. Hernandez-Calderon, Appl. Surf. Sci. 212, 583 (2003) http://dx.doi.org/10.1016/S0169-4332(03)00131-4[Crossref]
  • [17] D. Kaczmarek et al., Opt. Appl. 37, 433 (2007)
  • [18] D. Kaczmarek et al., Mater. Sci.-Poland 26, 113 (2008)
  • [19] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA, Card 21-1276 (1967)
  • [20] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA, Card 21-1272 (1967)
  • [21] H. L. Ma et al., Appl. Surf. Sci. 253, 7497 (2007) http://dx.doi.org/10.1016/j.apsusc.2007.03.047[Crossref]
  • [22] G. Bertoni et al., Ultramicroscopy 106, 630 (2006) http://dx.doi.org/10.1016/j.ultramic.2006.03.006[Crossref]
  • [23] J. Domaradzki et al., Vacuum 82, 1007 (2008) http://dx.doi.org/10.1016/j.vacuum.2008.01.021[Crossref]
  • [24] J. Domaradzki, D. Wojcieszak, E. Prociow, D. Kaczmarek, Acta Phys. Pol. A 116, 75 (2009)
  • [25] E. Prociow, J. Domaradzki, D. Kaczmarek, T. Berlicki, Polish patent No PL 211827 B1, 2012
  • [26] J. Domaradzki, D. Kaczmarek, E. Prociow, Polish patent No PL 210206 B1, 2011
  • [27] D. De Graaf, S. J. Stelwagen, H. T. Hintzen, G. de With, J. Non-Cryst. Solids 325, 29 (2003) http://dx.doi.org/10.1016/S0022-3093(03)00324-7[Crossref]
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.-psjd-doi-10_2478_s11534-012-0151-7
Identifiers
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.