Secondary electron microscopy and transmission electron microscopy studies of carbon nanotubes in C-Ni films

• Authors: Mirosław Kozłowski , Piotr Dłużewski , Ewa Kowalska , Elżbieta Czerwosz
• Languages of publication: EN

Abstracts

EN

Carbon nanotubes films have been studied with SEM and TEM. The studied films were obtained using a two step method: PVD process and CVD process. Strongly defected and curled carbon nanotubes containing Ni nanoparticles formed the film with thickness of about 300–400 nm. Observed carbon nanotubes were of lengths from 100 nm to 300 nm and did not stick to each other.

Keywords

EN

MWCNT; PVD; CVD; nickel nanoparticles

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2011
• Volume: 9
• Issue: 2
• Pages: 344-348

Dates

published

1 - 4 - 2011

online

20 - 2 - 2011

Contributors

author

Mirosław Kozłowski

• Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland

author

Piotr Dłużewski

• Institute of Physics PAS, Al. Lotników 32/46, 02-668, Warszawa, Poland

author

Ewa Kowalska

• Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland

author

Elżbieta Czerwosz

• Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland

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Identifiers

DOI

10.2478/s11534-010-0106-9