Dielectric properties of Ba3Sr2DyTi3V7O30 ceramics

• Authors: Priyadarshini Sahoo , Anuradha Panigrahi , Sunanda Patri , Rasm Choudhary
• Languages of publication: EN

Abstracts

EN

A polycrystalline sample, Ba3Sr2DyTi3V7O30, with tungsten bronze structure was prepared by a mixed-oxide method at high temperature (950°C). Preliminary structural analysis of the compound showed an orthorhombic crystal structure at room temperature. Surface morphology of the compound was studied by scanning electron microscopy. The dielectric anomaly at 321°C may be attributed to the ferro-paraelectric phase transitions. This was also confirmed from the appearance of a hysteresis loop. The nature of variation of the ac conductivity and value of activation energy at different temperature regions, suggest that the conduction process is of mixed-type (i.e., ionic-polaronic and space charge generated from the oxygen ion vacancies).

Keywords

EN

ceramics; X-ray diffraction; dielectric properties; electrical conductivity

Discipline

• 77.22.Ch: Permittivity (dielectric function)(for low-permittivity dielectric films, see 77.55.Bh; for high-permittivity gate dielectric films, 77.55.D-)
• 77.22.Ej: Polarization and depolarization
• 77.22.Gm: Dielectric loss and relaxation

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2010
• Volume: 8
• Issue: 4
• Pages: 639-642

Dates

published

1 - 8 - 2010

online

22 - 5 - 2010

Contributors

author

Priyadarshini Sahoo

• Department of Physics, Betnoti College Betnoti, Mayurbhanj, Orissa, India

author

Anuradha Panigrahi

• Department of Physics, D.N. College, Itanagar, Arunachal Pradesh, India

author

Sunanda Patri

• Department of Physics & Meteorology, IIT, Kharagpur, 721302, India

author

Rasm Choudhary

• Department of Physics & Meteorology, IIT, Kharagpur, 721302, India

References

• [1] M. E. Lines, A. M. Glass, Principles and Applications of Ferroelectrics and Related Materials(Claredon Press, Oxford, UK, 1977)
• [2] J. F. Scott, C. A. de Araujo, Science 246, 1400 (1989) http://dx.doi.org/10.1126/science.246.4936.1400[Crossref]
• [3] R. E. Newnham, L. J. Bowen, K. A. Klicker, L. E. Cross, Materials in Engineering 2, 93 (1980)
• [4] N. Wakiya, J. K. Wang, A. Saiki, K. Shinozakiand N. Mizutani, J. Eur. Ceram. Soc. 19, 1071 (1999) http://dx.doi.org/10.1016/S0955-2219(98)00376-8[Crossref]
• [5] R. E. Jones Jr. et al., Thin Solid Films 270, 584 (1995) http://dx.doi.org/10.1016/0040-6090(95)06754-X[Crossref]
• [6] T. Takahashi, K. Kuwabara, Y. Abe, Solid State Ionics 2, 139 (1981) http://dx.doi.org/10.1016/0167-2738(81)90171-5[Crossref]
• [7] M. R Raju, R. N. P. Choudhary, J. Mater. Sci. 39, 1765 (2004) http://dx.doi.org/10.1023/B:JMSC.0000016182.42768.cf[Crossref]
• [8] X. M. Chen, J. S. Yang, J. Eur. Ceram. Soc. 19, 139 (1999) http://dx.doi.org/10.1016/S0955-2219(98)00166-6[Crossref]
• [9] H. Ohsato, J. Eur. Ceram. Soc. 212703 (2001)
• [10] W. Jiang, W. Cao, X. Yi, H. Chen, J. Appl. Phys. 97, 094106/1–4 (2005)
• [11] P. S. Sahoo, A. Panigrahi, S. K. Patri, R. N. P. Choudhary, Mod. Phys. Lett. B 22, 2999 (2008) http://dx.doi.org/10.1142/S0217984908017448[Crossref]
• [12] M. R. Ranga Raju, R. N. P. Choudhary, Mater. Lett. 57, 2980 (2003) http://dx.doi.org/10.1016/S0167-577X(02)01408-8[Crossref]
• [13] H. P. Klug, L. B. Alexander, X-ray Diffraction Procedures (Wiley, New York, 1974)
• [14] B. D. Cullity, Elements of X-Ray Diffraction, 2nd ed. (Addison-Wesley, Philipines, 1978)
• [15] P. R. Das, R. N. P. Choudhary, B. K. Samantray, J. Alloy. Compd. 448, 32 (2008) http://dx.doi.org/10.1016/j.jallcom.2006.10.090[Crossref]
• [16] M. E. Lines, A. M. Glass, Principles and Applications of Ferroelectrics and Related Materials (Oxford University Press, Oxford, 1977)
• [17] A. Panigrahi, N. K. Singh, R. N. P. Choudhary., J. Phys. Chem. Solids 63, 213 (2002) http://dx.doi.org/10.1016/S0022-3697(01)00132-9[Crossref]
• [18] S. Kuharuangrong, J. Mater. Sci. 36, 1727 (2001) http://dx.doi.org/10.1023/A:1017568424068[Crossref]
• [19] B. Behera, P. Nayak, R. N. P. Choudhary, Curr. Appl. Phys. 9, 201 (2008) http://dx.doi.org/10.1016/j.cap.2008.01.016[Crossref]
• [20] P. S. Sahoo, A. Panigrahi, S. K. Patri, R. N. P. Choudhary, Cent. Eur. J. Phys. 6, 843 (2008) http://dx.doi.org/10.2478/s11534-008-0112-3[Crossref]

Identifiers

DOI

10.2478/s11534-009-0130-9