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Number of results

Journal

2008 | 6 | 2 | 351-355

Article title

Ultraviolet detectors based on ZnO films by thermal oxidation of Zn metallic films

Authors

Content

Title variants

Languages of publication

EN

Abstracts

EN
Metallic Zn films were deposited on glass substrates by electron-beam evaporation. ZnO films were synthesized by thermal oxidation of Zn metallic films in air. At the annealing temperature of 550 °C, ZnO nanowires appeared on the surface, which mainly result from the decrease of oxidation rate. A ZnO ultraviolet photodetector was fabricated based on a metal-semiconductor-metal planar structure. The detector showed a large UV photoresponse with an increase of two orders of magnitude. It is concluded that promising UV detectors can be obtained on ZnO films by thermal oxidation of Zn metallic films. The ways of performing spectral response measurements for polycrystalline ZnO films are also discussed.

Publisher

Journal

Year

Volume

6

Issue

2

Pages

351-355

Physical description

Dates

published
1 - 6 - 2008
online
26 - 3 - 2008

Contributors

author
  • Department of Physics, Linyi Normal University, Shandong, 276005, PR China
author

References

  • [1] Y. Liu et al., J. Elec. Mater. 29, 69 (2000) http://dx.doi.org/10.1007/s11664-000-0097-1[Crossref]
  • [2] H.S. Bae, S. Im, Thin Solid Films 469, 75 (2004) http://dx.doi.org/10.1016/j.tsf.2004.06.196[Crossref]
  • [3] S. Liang et al., J. Cryst. Growth 110, 225 (2001)
  • [4] M. Liu, H.K. Kim, Appl. Phys. Lett. 84, 173 (2004) http://dx.doi.org/10.1063/1.1640468[Crossref]
  • [5] N. Emanetoglu et al., Appl. Phys. Lett. 85, 3702 (2004) http://dx.doi.org/10.1063/1.1811383[Crossref]
  • [6] D. Basak, G. Amin, B. Mallik, G.K. Paul, S.K. Sen, J. Cryst. Growth 256, 73 (2003) http://dx.doi.org/10.1016/S0022-0248(03)01304-6[Crossref]
  • [7] M. Razeghi, A. Rogalski, J. Appl. Phys. 79, 7433 (1996) http://dx.doi.org/10.1063/1.362677[Crossref]
  • [8] H. Fabricius, T. Skettrup, P. Bisgaard, Appl. Optics 25, 2764 (1986) http://dx.doi.org/10.1364/AO.25.002764[Crossref]
  • [9] Y.A. Goldberg, Semicond. Sci. Technol. 14, 41 (1999) http://dx.doi.org/10.1088/0268-1242/14/7/201[Crossref]
  • [10] X.G. Zheng et al., Appl. Surf. Sci. 253, 2264 (2006) http://dx.doi.org/10.1016/j.apsusc.2006.04.031[Crossref]
  • [11] S. Cho et al., Appl. Phys. Lett. 75, 2761 (1999) http://dx.doi.org/10.1063/1.125141[Crossref]
  • [12] Y.G. Wang et al., J. Appl. Phys. 94, 354 (2003) http://dx.doi.org/10.1063/1.1577819[Crossref]
  • [13] Z. Jie et al., Appl. Surf. Sci. 229, 311 (2004) http://dx.doi.org/10.1016/j.apsusc.2004.02.010[Crossref]
  • [14] S.J. Chen et al., J. Cryst. Growth 240, 467 (2002) http://dx.doi.org/10.1016/S0022-0248(02)00925-9[Crossref]
  • [15] Y.G. Wang et al., Chem. Phys. Lett. 375, 113 (2003) http://dx.doi.org/10.1016/S0009-2614(03)00842-X[Crossref]
  • [16] P. Chang et al., Chem. Mater. 16, 5133 (2004) http://dx.doi.org/10.1021/cm049182c[Crossref]
  • [17] Y.J. Ma et al., Nanotechnology 16, 746 (2005) http://dx.doi.org/10.1088/0957-4484/16/6/020[Crossref]
  • [18] K. Sungyeon et al., J. Cryst. Growth 290, 485 (2006) http://dx.doi.org/10.1016/j.jcrysgro.2006.01.043[Crossref]
  • [19] G.H. Lee, H.D. Jeon, W.L. Lee, B.C. Shin, I.S. Kim, J. Cryst. Growth 277, 1 (2005) http://dx.doi.org/10.1016/j.jcrysgro.2004.12.134[Crossref]
  • [20] Z. Zhou, H. Deng, J. Yi, S. Liu, Mater. Res. Bull. 34, 1563 (1999) http://dx.doi.org/10.1016/S0025-5408(99)00183-X[Crossref]
  • [21] T.L. Tansley, D.F. Neely, Thin Solid Films 121, 95 (1984) http://dx.doi.org/10.1016/0040-6090(84)90231-1[Crossref]

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.-psjd-doi-10_2478_s11534-008-0042-0
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