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2010 | 8 | 6 | 1281-1287

Article title

Formation and characterization of CuxS layers on polyethylene film using the solutions of sulfur in carbon disulfide


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Results of the formation of copper sulfide layers using the solutions of elemental sulfur in carbon disulfide as precursor for sulfurization are presented. Low density polyethylene film can be effectively sulfurized in the solutions of rhombic (α) sulfur in carbon disulfide. The concentration of sulfur in polyethylene increases with the increase of the temperature and concentration of sulfur solution in carbon disulfide and it little depends on the duration of sulfurization. Electrically conductive copper sulfide layers on polyethylene film were formed when sulfurized polyethylene was treated with the solution of copper (II/I) salts. CuxS layer with the lowest sheet resistance (11.2 Ω cm−2) was formed when sulfurized polyethylene was treated with copper salts solution at 80°C. All samples with formed CuxS layers were characterized by X-ray photoelectron spectroscopy. XPS analysis of obtained layers showed that on the layer’s surface and in the etched surface various compounds of copper, sulfur and oxygen are present: Cu2S, CuS, CuO, S8, CuSO4, Cu(OH)2 and water. The biggest amounts of CuSO4 and Cu(OH)2 are present on the layer’s surface. Significantly more copper sulfides are found in the etched layers.










Physical description


1 - 12 - 2010
8 - 10 - 2010


  • Department of Inorganic Chemistry, Faculty of Chemical Technology, Kaunas University of Technology, LT-50254, Kaunas, Lithuania
  • Department of Inorganic Chemistry, Faculty of Chemical Technology, Kaunas University of Technology, LT-50254, Kaunas, Lithuania


  • [1] C. Cruz-Vázquez, M. Inoue, M.B. Inoue, R. Bernal, F.J. Espinoza-Beltrán, Thin Solid Films 373, 1 (2000) http://dx.doi.org/10.1016/S0040-6090(00)01078-6[Crossref]
  • [2] J. Cardoso, O. GomezDaza, L. Ixtlilco, M.T.S. Nair, P.K. Nair, Semicond. Sci. Technol. 16, 123 (2001) http://dx.doi.org/10.1088/0268-1242/16/2/311[Crossref]
  • [3] J. Johansson, J. Kostamo, M. Karppinen, L. Niinistö, J. Mater. Chem. 12, 1022 (2002) http://dx.doi.org/10.1039/b105901g[Crossref]
  • [4] P. Zhang, L. Gao, J. Mater. Chem. 13, 2007 (2003) http://dx.doi.org/10.1039/b305584a[Crossref]
  • [5] G. Mao, W. Dong, D.G. Kurth, H. Möhwald, Nano Letters 4, 249 (2004) http://dx.doi.org/10.1021/nl034966v[Crossref]
  • [6] A. Galdikas, A. Mironas, V. Strazdiene, A. Setkus, I. Ancutiene, V. Janickis, Sensors and Actuators B 67, 76 (2000) http://dx.doi.org/10.1016/S0925-4005(00)00408-1[Crossref]
  • [7] A. Setkus, A. Galdikas, A. Mironas, I. Simkiene, I. Ancutiene, V. Janickis, S. Kaciulis, G. Mattogno, G.M. Ingo, Thin Solid Films 391, 275 (2001) http://dx.doi.org/10.1016/S0040-6090(01)00995-6[Crossref]
  • [8] A. Setkus, A. Galdikas, A. Mironas, V. Strazdiene, I. Simkiene, I. Ancutiene, V. Janickis, S. Kaciulis, G. Mattogno, G.M. Ingo, Sensors and Actuators B 78, 208 (2001) http://dx.doi.org/10.1016/S0925-4005(01)00814-0[Crossref]
  • [9] O.P. Agnihotri, B.K. Gupta, Solar Selective Surfaces (Wiley, New York, 1981)
  • [10] K.L. Chopra, S.R. Das, Thin Film Solar Cells (Plenum, New York, 1983)
  • [11] M.T.S. Nair, P.K. Nair, Semicond. Sci. Technol. 4, 599 (1989) http://dx.doi.org/10.1088/0268-1242/4/7/020[Crossref]
  • [12] I. Grozdanov, M. Najdoski, J. Solid State Chem. 114, 469 (1995) http://dx.doi.org/10.1006/jssc.1995.1070[Crossref]
  • [13] C. Nascu, I. Pop, V. Ionescu, E. Indrea, I. Bratu, Mater. Lett. 32, 73 (1997) http://dx.doi.org/10.1016/S0167-577X(97)00015-3[Crossref]
  • [14] J. Hu, B. Deng, W. Zhang, K. Tang, Y. Qian, Int. J. Inorg. Mater. 3, 639 (2001) http://dx.doi.org/10.1016/S1466-6049(01)00163-5[Crossref]
  • [15] H.M. Pathan, C.D. Lokhande, Bull. Mater. Sci. 27, 85 (2004) http://dx.doi.org/10.1007/BF02708491[Crossref]
  • [16] A. Zebrauskas, Copper sulfide formation on polymers materials (Habil. Doct. Thesis, Vilnius, 1995) (in Lithuanian)
  • [17] I. Ancutiene, V. Janickis, R. Giesa, Polish J.Chem. 78, 349 (2004)
  • [18] V. Janickis, R. Maciulevicius, R. Ivanauskas, I. Ancutiene, Materials Science-Poland 23, 715 (2005)
  • [19] I. Ancutiene, V. Janickis, R. Ivanauskas, Applied Surface Science 252, 4218 (2006) http://dx.doi.org/10.1016/j.apsusc.2005.06.028[Crossref]
  • [20] M.A. Baranauskas, A.I. Žebrauskas, M.I. Šalkauskas, A.J. Prokopčik, Trans. Lithuanian Acad. Sci. Ser. B 2, 3 (1983) (in Russian)
  • [21] I. Ancutiene, V. Janickis, S. Grevys, A. Žebrauskas, Chemistry 4, 3 (1996)
  • [22] B. Meyer, Elemental sulphur: Chemistry and Physics (Interscience, New York, 1965)
  • [23] B.P. Nikolskij (Ed.), Reference book for chemists (Khimiya, Moscow, 1964)
  • [24] A. Babko, A. Pilipenko, Photometric analysis. Method for determination of non-metals (Khimiya, Moscow, 1979) (in Russian)
  • [25] Analytical methods for atomic absorption spectrometry, Perkin-Elmer 503 (1973)
  • [26] D. Briggs, M.P. Seah, Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (Wiley, New York, 1983)
  • [27] C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Data for Use in X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Eden Prairie, Minnesota, 1978)
  • [28] K. Burger, Solvation, ionic and complex formation reactions in non-aqueous solvents (Elsevier, Amsterdam, 1983)
  • [29] Z. Kacarevic-Popovic, D. Kostoski, L.J. Novalovic, Radiation Physics and Chemistry 55, 645 (1999) http://dx.doi.org/10.1016/S0969-806X(99)00262-5[Crossref]
  • [30] A. Bolero, M. Grossberg, B. Asenjo, M.T. Gutierrez, Surface & Coatings Technology 204, 593 (2009) http://dx.doi.org/10.1016/j.surfcoat.2009.08.037[Crossref]
  • [31] M. Kundu, T. Hasegawa, K. Terabe, K. Yamamoto, M. Aono, Sci. Technol. Adv. Mater. 9, 035011 (2008) http://dx.doi.org/10.1088/1468-6996/9/3/035011[Crossref]
  • [32] R. Sanjines, H. Tang, H. Berger, F. Gozzo, G. Margaritondo, F. Levy, J. Appl. Phys. 75, 2945 (1994) http://dx.doi.org/10.1063/1.356190[Crossref]
  • [33] S.M. Jung, P. Grange, Catalysis Letters 76, 27 (2001) http://dx.doi.org/10.1023/A:1016764524365[Crossref]
  • [34] V. Toniazzo, C. Mustin, J.M. Portal, B. Humbert, R. Benoit, R. Erre, Applied Surface Science 143, 229 (1999) http://dx.doi.org/10.1016/S0169-4332(98)00918-0[Crossref]
  • [35] J. Zhu, H. Chen, H. Lui, X. Yang, L. Lu, X. Wang, Mater. Sci. Eng. A 384, 172 (2004) http://dx.doi.org/10.1016/j.msea.2004.06.011[Crossref]

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