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Journal

2014 | 1 | 1 |

Article title

Magnetic properties of cobalt microwires measured by piezoresistive cantilever magnetometry

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EN

Abstracts

EN
We present the magnetic characterization of cobalt wires grown by focused electron beam-induced deposition (FEBID) and studied using static piezoresistive cantilever magnetometry. We have used previously developed high force sensitive submicron-thick silicon piezoresistive cantilevers. High quality polycrystalline cobalt microwires have been grown by FEBID onto the free end of the cantilevers using dual beam equipment. In the presence of an external magnetic field, the magnetic cobalt wires become magnetized, which leads to the magnetic field dependent static deflection of the cantilevers. We show that the piezoresistive signal from the cantilevers, corresponding to a maximum force of about 1 nN, can be measured as a function of the applied magnetic field with a good signal to noise ratio at room temperature. The results highlight the flexibility of the FEBID technique for the growth of magnetic structures on specific substrates, in this case piezoresistive cantilevers.

Publisher

Journal

Year

Volume

1

Issue

1

Physical description

Dates

received
13 - 5 - 2014
online
19 - 9 - 2014
accepted
7 - 7 - 2014

Contributors

author
  • Istituto Italiano di Tecnologia (IIT), Center for Bio-Molecular Nanotechnologies, Via Barsanti, 73010 Arnesano, Italy/Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), 08193 Bellaterra, Spain
  • Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada, Universidad de Zaragoza-CSIC, Facultad de Ciencias, 50009 Zaragoza, Spain/ Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain
author
  • Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain
  • Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada, Universidad de Zaragoza-CSIC, Facultad de Ciencias, 50009 Zaragoza, Spain/ Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain
  • Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), 08193 Bellaterra, Spain
author
  • Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), 08193 Bellaterra, Spain

References

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.-psjd-doi-10_2478_nanofab-2014-0008
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