Application of the Volterra filter in experimental diffraction data processing

• Authors: Stanislav Jurečka , Mária Jurečková
• Languages of publication: EN

Abstracts

EN

The effective signal in x-ray diffraction analysis of material properties often contains high frequency (noise) and low frequency (trend) components as additive parts. It is necessary to extract the effective signal from the noise to ensure high quality of signal processing. Digital filters of Volterra type are proposed for filtering purposes and a comparison of Volterra filtration implemented on x-ray diffraction data versus results from a set of other digital filters is given.

Keywords

EN

Volterra filters; x-ray diffraction analysis; 61.10Nz

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2003
• Volume: 1
• Issue: 3
• Pages: 440-452

Dates

published

1 - 9 - 2003

online

1 - 9 - 2003

Contributors

author

Stanislav Jurečka

• Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic

author

Mária Jurečková

• Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic

References

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Identifiers

DOI

10.2478/BF02475855