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Journal
2003 | 1 | 3 | 440-452
Article title

Application of the Volterra filter in experimental diffraction data processing

Content
Title variants
Languages of publication
EN
Abstracts
EN
The effective signal in x-ray diffraction analysis of material properties often contains high frequency (noise) and low frequency (trend) components as additive parts. It is necessary to extract the effective signal from the noise to ensure high quality of signal processing. Digital filters of Volterra type are proposed for filtering purposes and a comparison of Volterra filtration implemented on x-ray diffraction data versus results from a set of other digital filters is given.
Publisher

Journal
Year
Volume
1
Issue
3
Pages
440-452
Physical description
Dates
published
1 - 9 - 2003
online
1 - 9 - 2003
Contributors
  • Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic
  • Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic
References
  • [1] M. Meloun and J. Militký: Statistické zpracování exprimentálních dat, PLUS, Praha, 1994.
  • [2] L. Smrčok, M. Ďurík, V. Jorík: “Wavelet denoising of powder diffraction patterns”, Powder Diffraction, Vol. 14, (1999), pp. 300–304. [Crossref]
  • [3] J. Fiala: “Zpracování mených dat filtrací”, Materials Structure, Vol. 4, (1997), pp. 77–83.
  • [4] D. Kocur: Adaptívne Volterrove číslicové filtre. Elfa, Košice, 2001.
  • [5] R. Nowak and B. Van Veen: “Efficient methods for identification of Volterra filter models” Signal Processing, Vol. 38, No. 3, (1994), pp. 417–428. http://dx.doi.org/10.1016/0165-1684(94)90157-0[Crossref]
  • [6] R. Nowak and B. Van Veen: “Tensor product basis approximations for Volterra filters”, IEEE Trans. Signal Processing, Vol. 44, No. 1, (1996), pp. 36–51. http://dx.doi.org/10.1109/78.482010[Crossref]
  • [7] M. Schetzen: The Volterra and Wiener Theories of Nonlinear Systems, Wiley, New York, 1980.
  • [8] S., Jurečka, P. Šutta, M. Havlík: “Fourierova a waveletová filtrácia röntgenových difrakčných profilov”, In: Smery vývoja techniky pozemného vojska, Vojenská akadémia Liptovský Mikuláš, November 29–30, 2000, pp. 204–208.
  • [9] S. Jurečka and M. Havlík: “Porovnanie aproximačných a Fourierovských dekonvolu cnćh metód pri analýze rtg difrakčných profilov”, Materials Structure, Vol. 8, No. 2, (2001), pp. 83–87.
  • [10] J. Nelder and R. Mead: “A simplex method for function minimization”, Computer Journal, Vol. 7, (1965), pp. 308–313 [Crossref]
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.-psjd-doi-10_2478_BF02475855
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