Pulsed laser deposition of a PBN:65 morphotropic phase boundary thin film with large electrostriction

• Authors: Xi Yang , Andrew Beckwith , Mikhail Strikovski
• Languages of publication: EN

Abstracts

EN

We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 μm2/V2, and it is consistent with what we measured in the reflection experiment

Keywords

EN

Epitaxial thin films; field-induced strain; electrostrictive constant; 78.20.-e; 81.16.Mk

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2005
• Volume: 3
• Issue: 2
• Pages: 178-185

Dates

published

1 - 6 - 2005

online

1 - 6 - 2005

Contributors

author

Xi Yang

• Fermi National Accelerator Laboratory, P.O. Box 500, 60510-0500, Batavia, Illinois, USA

author

Andrew Beckwith

• Department of Physics, University of Houston, 77204-5005, Huston, Texas, USA

author

Mikhail Strikovski

• Department of Physics, University of Houston, 77204-5005, Huston, Texas, USA

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Identifiers

DOI

10.2478/BF02475585