Analysis of numerical limits in 2-D simulations of a ferromagnetic/antiferromagnetic interface using the random field Ising model

• Authors: Tomasz Błachowicz
• Languages of publication: EN

Abstracts

EN

This paper explains the Random Field Ising Model simulations of a two-dimensional ferromagnetic/antiferromagnetic interface, influenced by the exchange-bias interaction. Exchange-biased shifts, coercivity fields, the number of unreversed spins as well as the numerical errors are provided. These were tested for different structure dimensions and boundary conditions in order to find limitations of the method. The algorithm developed is simple, very effective, and provides deeper insight into the nature of the exchange-bias phenomenon.

Keywords

EN

Random field ising model; exchange-bias; spintronics; ferromagnetic-antiferromagnetic interface; magnetisation reversal; 75.10.-b; 75.30.Et; 75.70.Cn

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2005
• Volume: 3
• Issue: 2
• Pages: 147-162

Dates

published

1 - 6 - 2005

online

1 - 6 - 2005

Contributors

author

Tomasz Błachowicz

• Department of Microelectronics, Institute of Physics, Silesian University of Technology, Krzywoustego 2, 44-100, Gliwice, Poland

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Identifiers

DOI

10.2478/BF02475583