Multiscale semicontinuous thin film descriptors

• Authors: Jiří Boldyš , Rudolf Hrach
• Languages of publication: EN

Abstracts

EN

In experimental thin film physics, there is a demand to characterize a growing thin film or the thin film resulting from an experiment. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods is collected and further developed, which results in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles are analyzed in a multiscale manner. The descriptiveness of the proposed features is demonstrated on a few thin film photographs from real experiments. This work establishes a basis for further measurement, description, simulation or other processing in the physics of semicontinuous thin films, using any direct imaging modality.

Keywords

EN

semicontinuous thin films; wavelet transform; segmentation; skeleton; graph representation; 68.55.Jk; 02.30.Qy

• Publisher: De Gruyter Open
• Journal: Open Physics
• Year: 2004
• Volume: 2
• Issue: 4
• Pages: 645-659

Dates

published

1 - 12 - 2004

online

1 - 12 - 2004

Contributors

author

Jiří Boldyš

author

Rudolf Hrach

• Department of Electronics and Vacuum Physics, Faculty of Mathematics and Physics, Charles University, V Holešovičkách 2, 180 00, Prague 8, Czech Republic

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Identifiers

DOI

10.2478/BF02475567