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2004 | 2 | 4 | 645-659

Article title

Multiscale semicontinuous thin film descriptors


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In experimental thin film physics, there is a demand to characterize a growing thin film or the thin film resulting from an experiment. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods is collected and further developed, which results in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles are analyzed in a multiscale manner. The descriptiveness of the proposed features is demonstrated on a few thin film photographs from real experiments. This work establishes a basis for further measurement, description, simulation or other processing in the physics of semicontinuous thin films, using any direct imaging modality.










Physical description


1 - 12 - 2004
1 - 12 - 2004


  • Department of Electronics and Vacuum Physics, Faculty of Mathematics and Physics, Charles University, V Holešovičkách 2, 180 00, Prague 8, Czech Republic


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