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Number of results

Journal

2015 | 60 | 2 | 263-265

Article title

Second order reflection from crystals used in soft X-ray spectroscopy

Content

Title variants

Languages of publication

EN

Abstracts

EN
In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.

Keywords

Publisher

Journal

Year

Volume

60

Issue

2

Pages

263-265

Physical description

Dates

published
1 - 6 - 2015
received
12 - 5 - 2014
online
22 - 6 - 2015
accepted
5 - 10 - 2014

Contributors

  • Institute of Physics, Opole University, 48 Oleska Str., 45-052 Opole, Poland, Tel.: +48 77 452 7263, Fax: +48 77 452 7290

References

  • 1. Burek, A. J., Barrus, D. M., & Blake, R. L. (1974). Spectrometric properties of crystals for X-ray astronomy. Astrophys. J., 191, 533–543.
  • 2. McKenzie, D. L., Landecker, P. B., & Underwood, J. H. (1976). Crystals and collimators for X-ray spectrometry. Space Sci. Instrum., 2, 125–139.
  • 3. Der, R. C., Boster, T. A., Cunningham, M. E., Fortner, R. J., Kavanagh, T. M., & Khan, J. M. (1970). A small Bragg diffraction spectrometer. Rev. Sci. Instrum., 41, 1797–1800.
  • 4. Levis, M. (1982). A quantitative treatment of Bragg diffraction. Doctoral dissertation, University of Leicester, United Kingdom.

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.-psjd-doi-10_1515_nuka-2015-0046
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