Second order reflection from crystals used in soft X-ray spectroscopy

• Authors: Ireneusz Książek
• Languages of publication: EN

Abstracts

EN

In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.

Keywords

EN

soft X-ray; plasma spectroscopy; PbSt; KAP

• Publisher: De Gruyter Open
• Journal: Nukleonika
• Year: 2015
• Volume: 60
• Issue: 2
• Pages: 263-265

Dates

published

1 - 6 - 2015

received

12 - 5 - 2014

online

22 - 6 - 2015

accepted

5 - 10 - 2014

Contributors

author

Ireneusz Książek

• Institute of Physics, Opole University, 48 Oleska Str., 45-052 Opole, Poland, Tel.: [phone], Fax: [phone]

References

• 1. Burek, A. J., Barrus, D. M., & Blake, R. L. (1974). Spectrometric properties of crystals for X-ray astronomy. Astrophys. J., 191, 533–543.
• 2. McKenzie, D. L., Landecker, P. B., & Underwood, J. H. (1976). Crystals and collimators for X-ray spectrometry. Space Sci. Instrum., 2, 125–139.
• 3. Der, R. C., Boster, T. A., Cunningham, M. E., Fortner, R. J., Kavanagh, T. M., & Khan, J. M. (1970). A small Bragg diffraction spectrometer. Rev. Sci. Instrum., 41, 1797–1800.
• 4. Levis, M. (1982). A quantitative treatment of Bragg diffraction. Doctoral dissertation, University of Leicester, United Kingdom.

Identifiers

DOI

10.1515/nuka-2015-0046