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Journal
2015 | 60 | 2 | 263-265
Article title

Second order reflection from crystals used in soft X-ray spectroscopy

Content
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Languages of publication
EN
Abstracts
EN
In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
Keywords
Publisher
Journal
Year
Volume
60
Issue
2
Pages
263-265
Physical description
Dates
published
1 - 6 - 2015
received
12 - 5 - 2014
online
22 - 6 - 2015
accepted
5 - 10 - 2014
References
  • 1. Burek, A. J., Barrus, D. M., & Blake, R. L. (1974). Spectrometric properties of crystals for X-ray astronomy. Astrophys. J., 191, 533–543.
  • 2. McKenzie, D. L., Landecker, P. B., & Underwood, J. H. (1976). Crystals and collimators for X-ray spectrometry. Space Sci. Instrum., 2, 125–139.
  • 3. Der, R. C., Boster, T. A., Cunningham, M. E., Fortner, R. J., Kavanagh, T. M., & Khan, J. M. (1970). A small Bragg diffraction spectrometer. Rev. Sci. Instrum., 41, 1797–1800.
  • 4. Levis, M. (1982). A quantitative treatment of Bragg diffraction. Doctoral dissertation, University of Leicester, United Kingdom.
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.-psjd-doi-10_1515_nuka-2015-0046
Identifiers
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