Second order reflection from crystals used in soft X-ray spectroscopy
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In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
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- 4. Levis, M. (1982). A quantitative treatment of Bragg diffraction. Doctoral dissertation, University of Leicester, United Kingdom.
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